SMART ICT

ProMik SMART ICT delivers three test methods in a single flash station: MCU-driven peripheral testing, IEEE 1149.1 boundary scan, and functional testing of power rails, communication interfaces, memory, and sensors. By testing through existing programming interfaces rather than dedicated test points, SMART ICT dramatically reduces fixture complexity and cost while maintaining comprehensive fault coverage.

ICT Test Capabilities

Test Method	Coverage
MCU-Driven ICT	Peripheral testing via programming interfaces
Boundary Scan	IEEE 1149.1 solder joint and interconnect
Functional Test	Power rails, communication, memory, sensors
Resistance	1 ohm to 10M ohm
Capacitance	10 pF to 100 uF
Inductance	1 uH to 100 mH
Voltage	0 to 50V
Fault Isolation	Pin-level net and pin pair reporting
Fault Types	Opens, shorts, missing, wrong value
Integration	Unified with ProMik programming software

Pin-level fault isolation reports the exact net and pin pair for opens, shorts, missing components, and wrong values, enabling rapid root cause analysis. Built-in analog measurements cover resistance (1 ohm to 10M ohm), capacitance (10pF to 100uF), inductance (1uH to 100mH), and voltage (0 to 50V) for passive component verification. The unified software environment integrates ProMik programming, boundary scan, ICT, and functional test, with optimized sequences that minimize cycle time for high-volume production of compact PCBs where traditional ICT is impractical.

SMART ICT’s ability to test through programming interfaces rather than dedicated test points is a significant advantage for modern PCB designs where component density, BGA packages, and multi-layer routing leave little room for traditional ICT access points. By leveraging the JTAG, SWD, and SPI interfaces already present for programming, SMART ICT achieves comprehensive fault coverage with simpler, less expensive test fixtures.

Applications

• High-density PCB testing: testing through programming interfaces where BGA packages and fine-pitch routing eliminate traditional ICT access points
• Automotive ECU verification: combined programming and testing in a single fixture pass for IATF 16949 compliance
• Cost reduction: eliminates dedicated ICT fixtures and standalone test equipment by reusing existing MSP programming hardware
• Mixed-technology boards: verifying analog passives, digital ICs, and communication interfaces in one test sequence

ProMik Ecosystem

SMART ICT runs on existing MSP hardware as a software license add-on. Combined with FlashTask Pro and Boundary Scan Suite, it enables programming, boundary scan, ICT, and functional test from a single MSP programmer in one fixture pass, eliminating the need for separate test equipment.

GSAS Micro Systems provides SMART ICT with test strategy consulting, fixture design guidance, and integration support for production teams seeking to combine programming and testing in a single production step.