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Siemens EDA Tessent
Siemens EDA Siemens EDA

Tessent

IC Verification

Tessent from Siemens EDA: design-for-test (DFT) insertion, ATPG and test compression, memory and logic BIST, diagnosis and yield learning, and silicon lifecycle solutions for automotive and high-reliability ICs. Available in India from GSAS.

ATPG and compression

Tessent FastScan, TestKompress, ScanPro

Hierarchical DFT

Tessent Platform, Streaming Scan Network (SSN), RTL Pro

BIST

Tessent MemoryBIST, LogicBIST, In-System Test, MissionMode

Test access

IEEE 1149.1 BoundaryScan, IEEE 1687 IJTAG, IEEE 1838 multi-die

Diagnosis

Tessent Diagnosis, YieldInsight, SiliconInsight

Safety

ISO 26262 tool certification for each release (per Siemens)

Authorized Siemens EDA partner
Local FAE & application engineering
Hands-on training & integration
Manufacturer warranty

About Tessent

Tessent Silicon Lifecycle Management, DFT through in-field monitoring

Tessent is the Siemens EDA family of design-for-test (DFT) and silicon lifecycle tools. It puts test structures into a chip during design, generates the patterns that test it in manufacturing, diagnoses the parts that fail, and keeps testing and monitoring the chip after it ships.

Siemens describes Tessent Silicon Lifecycle Solutions as helping teams “deliver a faster time to market by reducing design complexity using high-quality DFT,” with “advanced debug, safety & security features and in-life data analytics.” GSAS Micro Systems supplies Tessent in India with local application engineering for DFT flow integration, automotive safety and production test.

The Four Tessent Solution Areas

Siemens organises Tessent into four solution areas. Each one maps to a stage of a chip’s life.

Solution areaStageWhat it covers
Tessent Advanced DFT (Test)Design and manufacturing testLogic and memory test, scan insertion, ATPG, compression, BIST, IEEE test access
Tessent Yield LearningProduction rampDiagnosis of failing parts, systematic defect identification, silicon bring-up
Tessent Safety and SecurityIn-field operationIn-system test, fault grading, ISO 26262 support, security across the lifecycle
Tessent Embedded AnalyticsValidation and deploymentOn-chip functional monitoring, trace and debug, including RISC-V

Tessent Advanced DFT: Test Structures and Patterns

This is where most DFT engineers spend their time. Siemens lists the following products under Tessent Test Solutions:

ProductWhat Siemens says it does
Tessent TestKompressDeterministic scan test “using patented on-chip compression to reduce test data volume and cut test time”
Tessent FastScanATPG that can be “applied to most any type of design” to generate high-coverage, compact test sets
Tessent ScanProScan insertion, hierarchical DFT and logic BIST readiness
Tessent Streaming Scan Network (SSN)Decouples core-level and chip-level DFT requirements to cut DFT development time and test cost
Tessent PlatformAutomation of the Tessent flow for hierarchical DFT
Tessent RTL ProSoftware to streamline a broad range of DFT tasks for IC design teams
Tessent MemoryBISTTest, repair, debug and characterisation of embedded memories
Tessent LogicBISTLogic built-in self-test for safety-critical ICs such as automotive and medical
Tessent In-System TestApplies deterministic test patterns in-system, as an alternative to traditional logic BIST
Tessent MissionModeIC test and diagnosis at any point during a vehicle’s functional operation
Tessent BoundaryScanIEEE 1149.1 boundary scan insertion
Tessent IJTAG and IJTAG ProIEEE 1687 instrument integration and faster IJTAG pattern loading
Tessent Multi-dieIEEE 1838-compliant test access for 3D stacked ICs
Tessent AnalogTestAnalog test pattern development and verification
Tessent DefectSimTransistor-level defect simulation for analog, mixed-signal and non-scan circuits

Streaming Scan Network for large SoCs and chiplets

For large SoCs built from many cores, the hard part of DFT is getting scan data to every core without the chip-level test architecture dictating every core’s design. Siemens describes Tessent SSN as eliminating “the difficult and costly trade-offs between test implementation effort and manufacturing test cost by decoupling core-level and chip-level DFT requirements.” Siemens’ Tessent Test Solutions page notes that SSN won the Siemens Innovator of the Year 2022 award for Outstanding Invention.

Tessent for Automotive: ISO 26262 and In-System Test

Automotive ICs must be tested not only in the factory but during the vehicle’s life, to catch latent faults. Siemens’ Tessent Safety and Security pages state:

  • ISO 26262 tool certification: “for each release there is an ISO 26262 certification that ensure the tools are suitable for use with Automotive projects.”
  • BIST as a safety mechanism: “Both Memory BIST and Logic BIST are great technologies to use as a safety mechanism, as they provide extremely high diagnostics coverage with minimal area.”
  • In-field test: the MissionMode in-system test controller lets teams run system tests in many different scenarios while the device is in its target application.

Siemens introduced Tessent In-System Test on 5 November 2024, describing it as working with Tessent SSN so customers can “apply embedded deterministic test patterns in-system throughout a product’s lifecycle.” Patterns generated with Tessent TestKompress are applied through standard APB or AXI bus interfaces. Siemens names automotive, aerospace and medical devices as the industries where this matters most.

Tessent Yield Learning: Diagnosis After Manufacturing

When parts fail production test, the question becomes why. Siemens lists three tools:

  • Tessent Diagnosis applies “layout-aware and cell-aware diagnosis technologies to accurately classify and identify the location of defects causing failures during manufacturing tests.”
  • Tessent YieldInsight removes noise from diagnosis data to find systematic yield limiters and pick the best devices for failure analysis.
  • Tessent SiliconInsight speeds test bring-up, debug and silicon characterisation of devices that contain Tessent test structures.

Tessent Embedded Analytics

Siemens describes Tessent Embedded Analytics as functional monitoring that enables “processor and system-wide trace and debug in real-time and post-deployment analytics for complex System-on-Chips.” It includes Tessent UltraSight-V for RISC-V debug and trace, and Tessent UltraSight for wider SoC monitoring. Siemens states the solution is processor-agnostic.

Who Uses Tessent in India

  • SoC and ASIC DFT teams inserting scan, compression and BIST and generating ATPG patterns before tapeout.
  • Automotive semiconductor teams that need ISO 26262 in-system test and fault grading.
  • Product and test engineering teams diagnosing production failures and ramping yield.
  • RISC-V and SoC validation teams that need on-chip trace and debug.

How GSAS Supports Tessent Teams in India

GSAS Micro Systems is an authorized Siemens EDA partner in India and a value added distributor/reseller for Siemens EDA products. We have a dedicated FAE team ready to help you with custom built solutions matching your needs. Our application engineers work with DFT and test teams in Bengaluru, Hyderabad, Chennai, Pune, Mumbai and Delhi NCR on:

  • DFT flow integration: fitting Tessent into your synthesis and implementation flow.
  • Automotive safety: planning in-system test and BIST as safety mechanisms for ISO 26262 programmes.
  • Production test: pattern generation, test time reduction and diagnosis set-up.
  • Licensing and procurement: INR quotes with GST invoicing for the Tessent configuration your flow needs.

Tessent works alongside other Siemens IC tools we supply: Questa One, whose Sim DX engine accelerates DFT pattern verification with Tessent and whose Sim FX engine handles fault simulation, and Calibre for physical signoff. See the full Siemens EDA partner page.

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References

Common questions about Tessent

What is Tessent?
Tessent is the Siemens EDA family of design-for-test (DFT) and silicon lifecycle tools. It covers inserting test structures into a chip, generating manufacturing test patterns (ATPG), built-in self-test for memories and logic, diagnosing failures to improve yield, and monitoring and testing chips after they are deployed.
Are the Tessent tools ISO 26262 certified?
Siemens states that for each Tessent release there is an ISO 26262 certification that ensures the tools are suitable for use with automotive projects. Siemens also positions Tessent LogicBIST and Tessent MissionMode for ISO 26262 in-system test of safety-critical ICs.
What is the difference between Tessent TestKompress and Tessent FastScan?
Both generate manufacturing test patterns. Tessent TestKompress uses on-chip compression to reduce test data volume and cut test time. Tessent FastScan is the ATPG tool Siemens describes as able to be applied to most any type of design to generate high-coverage, compact test sets.
What is Tessent Streaming Scan Network (SSN)?
Tessent Streaming Scan Network (SSN) is a packetized way of delivering scan test data that decouples core-level and chip-level DFT requirements. Siemens says it reduces DFT development time and manufacturing test cost.
Is Tessent available in India?
Yes. GSAS Micro Systems, an authorized Siemens EDA engineering partner in India, provides Tessent licensing and technical support for semiconductor design and test teams, with expertise in DFT flow integration, automotive safety compliance, and production test optimization.

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