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Siemens EDA Tessent
Siemens EDA Siemens EDA

Tessent

IC Verification

Design-for-test (DFT) insertion, ATPG, BIST, diagnosis, and silicon lifecycle management for automotive and high-reliability ICs. Available in India from GSAS.

DFT

Scan chain insertion, wrapper, and compression

ATPG

Automatic test pattern generation with fault simulation

BIST

Memory BIST, logic BIST, I/O BIST

Diagnosis

Volume diagnosis and yield learning

Safety

ISO 26262 ASIL D in-system test and monitoring

SLM

Silicon lifecycle management (in-field monitoring)

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Authorized Siemens EDA partner
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About Tessent

Tessent Silicon Lifecycle Management, DFT through in-field monitoring

Tessent from Siemens EDA is the industry’s most comprehensive platform for design-for-test (DFT), production test, diagnosis, and silicon lifecycle management. It spans the full IC test lifecycle, from DFT insertion during design, through test pattern generation for manufacturing, to in-field monitoring during the operational life of the chip. Tessent is the de facto standard for automotive ICs requiring ISO 26262 compliance and for any high-reliability application where silicon quality and in-field safety are non-negotiable.

The platform covers every aspect of IC test and quality. Tessent Shell provides unified DFT insertion including scan chain stitching, test compression, and wrapper architecture for hierarchical design. Tessent TestKompress generates highly compressed ATPG patterns that minimize test time and ATE memory while maintaining fault coverage. Tessent MemoryBIST and Tessent LogicBIST embed self-test controllers for on-chip testing without external ATE. Tessent Diagnosis analyzes production test failures to identify root-cause defect locations, enabling yield learning feedback to the foundry.

CapabilityDetail
Tessent ShellUnified DFT insertion (scan, compression, wrapper)
Tessent TestKompressCompressed ATPG with high fault coverage
Tessent MemoryBISTEmbedded memory self-test and repair
Tessent LogicBISTEmbedded logic self-test controller
Tessent DiagnosisVolume diagnosis and yield learning
Tessent SafetyISO 26262 in-system test (LBIST, MBIST at runtime)
Tessent SLMSilicon lifecycle management (aging, degradation monitoring)
Boundary ScanIEEE 1149.1 JTAG insertion and test

For automotive IC teams, Tessent Safety provides the in-system test infrastructure that ISO 26262 requires for ASIL B through ASIL D functional safety, periodic LBIST and MBIST execution during vehicle operation to detect latent faults. Tessent Silicon Lifecycle Management extends this capability beyond manufacturing test into the operational life of the chip, monitoring aging, thermal stress, and degradation in the field.

GSAS Micro Systems provides Tessent licensing and technical support for semiconductor design and test teams across India, with expertise in DFT flow integration, automotive safety compliance, and production test optimization.

Common questions about Tessent

Does Tessent support ISO 26262 automotive safety requirements?
Yes. Tessent Safety provides the in-system test infrastructure ISO 26262 requires for ASIL B through ASIL D functional safety, running periodic LBIST and MBIST during vehicle operation to detect latent faults. Tessent Silicon Lifecycle Management extends monitoring into the chip's operational life.
What is the difference between Tessent DFT insertion and Tessent Diagnosis?
Tessent Shell handles DFT insertion, scan chain stitching, test compression, and wrapper architecture, during the design phase. Tessent Diagnosis analyzes production test failures after manufacturing to identify root-cause defect locations, feeding yield-learning data back to the foundry.
Is Tessent available in India?
Yes. GSAS Micro Systems, an authorized Siemens EDA engineering partner in India, provides Tessent licensing and technical support for semiconductor design and test teams, with expertise in DFT flow integration, automotive safety compliance, and production test optimization.

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